Simulating an electron image at high resolution
نویسندگان
چکیده
منابع مشابه
Scanning transmission electron microscopy at high resolution.
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1987
ISSN: 0108-7673
DOI: 10.1107/s0108767387078838